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Preparation of clean reconstructed InAs(001) surfaces using HCl/isopropanol wet treatments

Identifieur interne : 000540 ( Russie/Analysis ); précédent : 000539; suivant : 000541

Preparation of clean reconstructed InAs(001) surfaces using HCl/isopropanol wet treatments

Auteurs : RBID : Pascal:03-0265393

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Abstract

A simple treatment method using HCl/isopropanol solutions is given for preparation of high-quality InAs(001) surfaces. The surface structure and chemistry were characterized using low-energy electron diffraction and photoemission spectroscopy as a function of UHV temperature. The treatment removes the natural oxide and leaves on the surface a physisorbed overlayer containing arsenic and small amounts of InClx. Annealing at 330°C induces desorption of this overlayer and reveals a clean arsenic-rich (2×4)/c(2×8) surface. The indium-rich (4×2)/c(8×2) reconstruction is obtained upon further annealing to 410°C. © 2003 American Institute of Physics.

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Pascal:03-0265393

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<record>
<TEI>
<teiHeader>
<fileDesc>
<titleStmt>
<title xml:lang="en" level="a">Preparation of clean reconstructed InAs(001) surfaces using HCl/isopropanol wet treatments</title>
<author>
<name sortKey="Tereshchenko, O E" uniqKey="Tereshchenko O">O. E. Tereshchenko</name>
<affiliation wicri:level="1">
<inist:fA14 i1="01">
<s1>Institute of Semiconductor Physics, Novosibirsk State University, 630090 Novosibirsk, Russia</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">Russie</country>
<wicri:regionArea>Institute of Semiconductor Physics, Novosibirsk State University, 630090 Novosibirsk</wicri:regionArea>
<wicri:noRegion>630090 Novosibirsk</wicri:noRegion>
</affiliation>
<affiliation wicri:level="3">
<inist:fA14 i1="02">
<s1>Laboratoire de Physique de la Matiere Condensee, Ecole Polytechnique, 91128 Palaiseau cedex, France</s1>
</inist:fA14>
<country xml:lang="fr">France</country>
<wicri:regionArea>Laboratoire de Physique de la Matiere Condensee, Ecole Polytechnique, 91128 Palaiseau cedex</wicri:regionArea>
<placeName>
<region type="region" nuts="2">Île-de-France</region>
<settlement type="city">Palaiseau</settlement>
</placeName>
</affiliation>
<affiliation wicri:level="1">
<inist:fA14 i1="03">
<s1>Dipartimento di Fisica and INFM, Universita Tor Vergata, 00133 Roma, Italy</s1>
</inist:fA14>
<country xml:lang="fr">Italie</country>
<wicri:regionArea>Dipartimento di Fisica and INFM, Universita Tor Vergata, 00133 Roma</wicri:regionArea>
<placeName>
<settlement type="city">Rome</settlement>
<region nuts="2">Latium</region>
</placeName>
</affiliation>
</author>
<author>
<name sortKey="Paget, D" uniqKey="Paget D">D. Paget</name>
<affiliation wicri:level="1">
<inist:fA14 i1="01">
<s1>Institute of Semiconductor Physics, Novosibirsk State University, 630090 Novosibirsk, Russia</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">Russie</country>
<wicri:regionArea>Institute of Semiconductor Physics, Novosibirsk State University, 630090 Novosibirsk</wicri:regionArea>
<wicri:noRegion>630090 Novosibirsk</wicri:noRegion>
</affiliation>
</author>
<author>
<name sortKey="Chiaradia, P" uniqKey="Chiaradia P">P. Chiaradia</name>
<affiliation wicri:level="1">
<inist:fA14 i1="01">
<s1>Institute of Semiconductor Physics, Novosibirsk State University, 630090 Novosibirsk, Russia</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">Russie</country>
<wicri:regionArea>Institute of Semiconductor Physics, Novosibirsk State University, 630090 Novosibirsk</wicri:regionArea>
<wicri:noRegion>630090 Novosibirsk</wicri:noRegion>
</affiliation>
</author>
<author>
<name sortKey="Bonnet, J E" uniqKey="Bonnet J">J. E. Bonnet</name>
</author>
<author>
<name sortKey="Wiame, F" uniqKey="Wiame F">F. Wiame</name>
</author>
<author>
<name sortKey="Taleb Ibrahimi, A" uniqKey="Taleb Ibrahimi A">A. Taleb Ibrahimi</name>
</author>
</titleStmt>
<publicationStmt>
<idno type="inist">03-0265393</idno>
<date when="2003-06-16">2003-06-16</date>
<idno type="stanalyst">PASCAL 03-0265393 AIP</idno>
<idno type="RBID">Pascal:03-0265393</idno>
<idno type="wicri:Area/Main/Corpus">00D367</idno>
<idno type="wicri:Area/Main/Repository">00C264</idno>
<idno type="wicri:Area/Russie/Extraction">000540</idno>
</publicationStmt>
<seriesStmt>
<idno type="ISSN">0003-6951</idno>
<title level="j" type="abbreviated">Appl. phys. lett.</title>
<title level="j" type="main">Applied physics letters</title>
</seriesStmt>
</fileDesc>
<profileDesc>
<textClass>
<keywords scheme="KwdEn" xml:lang="en">
<term>Annealing</term>
<term>Desorption</term>
<term>Experimental study</term>
<term>III-V semiconductors</term>
<term>Indium compounds</term>
<term>LEED</term>
<term>Photoelectron spectra</term>
<term>Surface reconstruction</term>
<term>Surface treatments</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr">
<term>8105E</term>
<term>8165</term>
<term>6835B</term>
<term>6843M</term>
<term>6172C</term>
<term>7960B</term>
<term>Etude expérimentale</term>
<term>Indium composé</term>
<term>Semiconducteur III-V</term>
<term>Reconstruction surface</term>
<term>Traitement surface</term>
<term>LEED</term>
<term>Désorption</term>
<term>Recuit</term>
<term>Spectre photoélectron</term>
</keywords>
</textClass>
</profileDesc>
</teiHeader>
<front>
<div type="abstract" xml:lang="en">A simple treatment method using HCl/isopropanol solutions is given for preparation of high-quality InAs(001) surfaces. The surface structure and chemistry were characterized using low-energy electron diffraction and photoemission spectroscopy as a function of UHV temperature. The treatment removes the natural oxide and leaves on the surface a physisorbed overlayer containing arsenic and small amounts of InCl
<sub>x</sub>
. Annealing at 330°C induces desorption of this overlayer and reveals a clean arsenic-rich (2×4)/c(2×8) surface. The indium-rich (4×2)/c(8×2) reconstruction is obtained upon further annealing to 410°C. © 2003 American Institute of Physics.</div>
</front>
</TEI>
<inist>
<standard h6="B">
<pA>
<fA01 i1="01" i2="1">
<s0>0003-6951</s0>
</fA01>
<fA02 i1="01">
<s0>APPLAB</s0>
</fA02>
<fA03 i2="1">
<s0>Appl. phys. lett.</s0>
</fA03>
<fA05>
<s2>82</s2>
</fA05>
<fA06>
<s2>24</s2>
</fA06>
<fA08 i1="01" i2="1" l="ENG">
<s1>Preparation of clean reconstructed InAs(001) surfaces using HCl/isopropanol wet treatments</s1>
</fA08>
<fA11 i1="01" i2="1">
<s1>TERESHCHENKO (O. E.)</s1>
</fA11>
<fA11 i1="02" i2="1">
<s1>PAGET (D.)</s1>
</fA11>
<fA11 i1="03" i2="1">
<s1>CHIARADIA (P.)</s1>
</fA11>
<fA11 i1="04" i2="1">
<s1>BONNET (J. E.)</s1>
</fA11>
<fA11 i1="05" i2="1">
<s1>WIAME (F.)</s1>
</fA11>
<fA11 i1="06" i2="1">
<s1>TALEB IBRAHIMI (A.)</s1>
</fA11>
<fA14 i1="01">
<s1>Institute of Semiconductor Physics, Novosibirsk State University, 630090 Novosibirsk, Russia</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>3 aut.</sZ>
</fA14>
<fA14 i1="02">
<s1>Laboratoire de Physique de la Matiere Condensee, Ecole Polytechnique, 91128 Palaiseau cedex, France</s1>
</fA14>
<fA14 i1="03">
<s1>Dipartimento di Fisica and INFM, Universita Tor Vergata, 00133 Roma, Italy</s1>
</fA14>
<fA14 i1="04">
<s1>LURE, Universite Paris-Sud, 91405, Orsay, France</s1>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
</fA14>
<fA20>
<s1>4280-4282</s1>
</fA20>
<fA21>
<s1>2003-06-16</s1>
</fA21>
<fA23 i1="01">
<s0>ENG</s0>
</fA23>
<fA43 i1="01">
<s1>INIST</s1>
<s2>10020</s2>
</fA43>
<fA44>
<s0>8100</s0>
<s1>© 2003 American Institute of Physics. All rights reserved.</s1>
</fA44>
<fA47 i1="01" i2="1">
<s0>03-0265393</s0>
</fA47>
<fA60>
<s1>P</s1>
</fA60>
<fA61>
<s0>A</s0>
</fA61>
<fA64 i1="01" i2="1">
<s0>Applied physics letters</s0>
</fA64>
<fA66 i1="01">
<s0>USA</s0>
</fA66>
<fC01 i1="01" l="ENG">
<s0>A simple treatment method using HCl/isopropanol solutions is given for preparation of high-quality InAs(001) surfaces. The surface structure and chemistry were characterized using low-energy electron diffraction and photoemission spectroscopy as a function of UHV temperature. The treatment removes the natural oxide and leaves on the surface a physisorbed overlayer containing arsenic and small amounts of InCl
<sub>x</sub>
. Annealing at 330°C induces desorption of this overlayer and reveals a clean arsenic-rich (2×4)/c(2×8) surface. The indium-rich (4×2)/c(8×2) reconstruction is obtained upon further annealing to 410°C. © 2003 American Institute of Physics.</s0>
</fC01>
<fC02 i1="01" i2="3">
<s0>001B80A05H</s0>
</fC02>
<fC02 i1="02" i2="3">
<s0>001B80A65</s0>
</fC02>
<fC02 i1="03" i2="3">
<s0>001B60H35B</s0>
</fC02>
<fC02 i1="04" i2="3">
<s0>001B60H45D</s0>
</fC02>
<fC02 i1="05" i2="3">
<s0>001B60A72C</s0>
</fC02>
<fC02 i1="06" i2="3">
<s0>001B70I60B</s0>
</fC02>
<fC03 i1="01" i2="3" l="FRE">
<s0>8105E</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="02" i2="3" l="FRE">
<s0>8165</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="03" i2="3" l="FRE">
<s0>6835B</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="04" i2="3" l="FRE">
<s0>6843M</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="05" i2="3" l="FRE">
<s0>6172C</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="06" i2="3" l="FRE">
<s0>7960B</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="07" i2="3" l="FRE">
<s0>Etude expérimentale</s0>
</fC03>
<fC03 i1="07" i2="3" l="ENG">
<s0>Experimental study</s0>
</fC03>
<fC03 i1="08" i2="3" l="FRE">
<s0>Indium composé</s0>
</fC03>
<fC03 i1="08" i2="3" l="ENG">
<s0>Indium compounds</s0>
</fC03>
<fC03 i1="09" i2="3" l="FRE">
<s0>Semiconducteur III-V</s0>
</fC03>
<fC03 i1="09" i2="3" l="ENG">
<s0>III-V semiconductors</s0>
</fC03>
<fC03 i1="10" i2="3" l="FRE">
<s0>Reconstruction surface</s0>
</fC03>
<fC03 i1="10" i2="3" l="ENG">
<s0>Surface reconstruction</s0>
</fC03>
<fC03 i1="11" i2="3" l="FRE">
<s0>Traitement surface</s0>
</fC03>
<fC03 i1="11" i2="3" l="ENG">
<s0>Surface treatments</s0>
</fC03>
<fC03 i1="12" i2="3" l="FRE">
<s0>LEED</s0>
</fC03>
<fC03 i1="12" i2="3" l="ENG">
<s0>LEED</s0>
</fC03>
<fC03 i1="13" i2="3" l="FRE">
<s0>Désorption</s0>
</fC03>
<fC03 i1="13" i2="3" l="ENG">
<s0>Desorption</s0>
</fC03>
<fC03 i1="14" i2="3" l="FRE">
<s0>Recuit</s0>
</fC03>
<fC03 i1="14" i2="3" l="ENG">
<s0>Annealing</s0>
</fC03>
<fC03 i1="15" i2="3" l="FRE">
<s0>Spectre photoélectron</s0>
</fC03>
<fC03 i1="15" i2="3" l="ENG">
<s0>Photoelectron spectra</s0>
</fC03>
<fN21>
<s1>167</s1>
</fN21>
<fN47 i1="01" i2="1">
<s0>0323M000179</s0>
</fN47>
</pA>
</standard>
</inist>
</record>

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